Abstract:In this paper we examine how single-event upsets (SEU) and related charge collection characteristics in microelectronic circuits and devices depend on the depth of charge deposited by a picosecond laser pulse. Charge tracks of variable length are generated by tuning the laser wavelength through the semiconductor absorption spectrum. Our results show that the variable-length charge tracks provide a unique and sensitive probe of the charge collection volume of a micro-electronic circuitldevice. In favorable case… Show more
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