Investigations of ION Beam Quality from a Pulsed Power Pinched Diode Using Particle-in-Cell Simulations

Foster, J. C.; McClory, John W.; Swanekamp, S. B.; Hinshelwood, D.D.; Ottinger, P. F.; Mosher, D.; Richardson, A. S.; Adamson, P.; Schumer, J. W.

doi:10.1109/icops45751.2022.9813282

2022 IEEE International Conference on Plasma Science (ICOPS) 2022

DOI: 10.1109/icops45751.2022.9813282

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Investigations of ION Beam Quality from a Pulsed Power Pinched Diode Using Particle-in-Cell Simulations

J. C. Foster

John W. McClory

S. B. Swanekamp

et al.

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Investigations of ION Beam Quality from a Pulsed Power Pinched Diode Using Particle-in-Cell Simulations

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