2014
DOI: 10.1007/s10854-014-2288-1
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Investigation on the intermetallic compound layer growth of Sn–0.5Ag–0.7Cu–xGa/Cu solder joints during isothermal aging

Abstract: This work was focused on the influence of Ga on the thermal properties, microstructural evolution and interfacial morphology with aging treatment at 150°C of low-silver Sn-0.5Ag-0.7Cu (SAC) lead-free solder. The melting temperature of the SAC-Ga solder was decreased owing to the low melting point element Ga and the formations of intermetallic compound (IMC) and growth at the interfaces of SAC/Cu and SAC-0.5Ga/Cu were studied for different aging time ranging from 0 to 720 h. The results indicated that for both … Show more

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Cited by 14 publications
(4 citation statements)
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References 22 publications
(25 reference statements)
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“…Ga can be easily enriched on the surface of the Sn-Pb solder liquid surface and form a dense protective film to improve the oxidation resistance of the solder [6,7]. Similarly, in this paper, Ga is added into the solder to ameliorate such problems.…”
Section: Introductionmentioning
confidence: 96%
“…Ga can be easily enriched on the surface of the Sn-Pb solder liquid surface and form a dense protective film to improve the oxidation resistance of the solder [6,7]. Similarly, in this paper, Ga is added into the solder to ameliorate such problems.…”
Section: Introductionmentioning
confidence: 96%
“…But there are some disturbing issues about the new generation of solder. Firstly, the content of Ag is a key factor which restricts the application of SAC solders [3]. The solder joints fatigue strength can be improved with the addition of Ag, meanwhile the resistivity and melting point will reduce.…”
Section: Introductionmentioning
confidence: 99%
“…It is generally difficult to observe; thus, the analysis of this IMC growth needs to be done under large magnification. The soldered alloy for Sn3Ag0.5Cu also showed that only 6 5 was present at the joint, and this is most probably because of Cu having higher diffusivity in Sn as compared to Ag (Luo, Xue & Liu, 2014). Furthermore, using OSP substrate would provide more Cu atoms from the PCB simultaneously.…”
Section: Imc Formation: Sn-osp/enigmentioning
confidence: 98%
“…With Ga addition into the solder, the IMC growth was significantly slowed down. The thickness of IMC was affected by the diffusion of Cu and Ni as substrates, in which the activities of Cu and Ni atoms were halted due to the presence of Ga that formed new IMC phase (Luo, Xue & Liu, 2014).…”
Section: Imc Formation: Sn-osp/enigmentioning
confidence: 99%