2018
DOI: 10.1088/2053-1591/aac1dc
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Investigation on growth, structural, optical, electrical and X-ray sensing properties of chemically deposited zinc bismuth sulfide (ZnxBi2−xS3) thin films

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Cited by 4 publications
(2 citation statements)
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“…Lattice factors “ a , b , and c ”, unit cell volume “ V cell ”, Scherrer crystallite size “ D ” [ 44 ], X-ray density “ ρ X-ray ” dislocation density and microstrain were calculated using Equations (1)–(6). where β is the full width at half maximum intensity, λ is the X-ray wavelength and is equal to 0.15406 nm, θ is Bragg’s angle, k is the constant equal to 0.94, Z is the number of molecules per formula unit, and M is the molar mass.…”
Section: Resultsmentioning
confidence: 99%
“…Lattice factors “ a , b , and c ”, unit cell volume “ V cell ”, Scherrer crystallite size “ D ” [ 44 ], X-ray density “ ρ X-ray ” dislocation density and microstrain were calculated using Equations (1)–(6). where β is the full width at half maximum intensity, λ is the X-ray wavelength and is equal to 0.15406 nm, θ is Bragg’s angle, k is the constant equal to 0.94, Z is the number of molecules per formula unit, and M is the molar mass.…”
Section: Resultsmentioning
confidence: 99%
“…Electrical conductivity depends on the year for Bi 2 S 3 -based thin films, which were prepared for different methods (CBD refers to chemical bath deposition; SP refers to spray pyrolysis; CD refers to chemical drop method; ALD refers to atomic layer deposition; EBP refers to electron beam patterned; SILAR refers to successive ionic layer adsorption and reaction; SAMs refers to self-assembled monolayers; NRs refers to nanorods, NWs refers to nanowires, The literature points correspond to data in refs , , , , , and .…”
mentioning
confidence: 99%