2023
DOI: 10.1016/j.mejo.2023.105923
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Investigation on effect of AlN barrier thickness and lateral scalability of Fe-doped recessed T-gate AlN/GaN/SiC HEMT with polarization-graded back barrier for future RF electronic applications

B. Mounika,
J. Ajayan,
Sandip Bhattacharya
et al.
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Cited by 7 publications
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