2016
DOI: 10.1080/02670844.2016.1146443
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Investigation on a magnesiothermic reduction process for preparation of nanocrystalline silicon thin film

Abstract: Nanocrystalline silicon thin films were successfully prepared via a magnesiothermic reduction process. The initial magnesium content was restricted by the thickness of the film deposited on a quartz glass substrate by magnetron sputtering. After the magnesiothermic reduction process, the Raman spectroscopy results revealed a strong correlation between the thickness of the nanocrystalline thin films and the initial magnesium content. The thickness of the nanocrystalline thin films first increased to a maximum a… Show more

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Cited by 8 publications
(15 citation statements)
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References 25 publications
(44 reference statements)
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“…In the reaction with the magnesium deposited on the substrates, however, it was found from X‐ray diffraction that silicon crystallites are generated . In this case, silicon could be prepared under the condition, in which the amount of magnesium is limited, as well as the cases that have previously been reported …”
Section: Introductionmentioning
confidence: 91%
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“…In the reaction with the magnesium deposited on the substrates, however, it was found from X‐ray diffraction that silicon crystallites are generated . In this case, silicon could be prepared under the condition, in which the amount of magnesium is limited, as well as the cases that have previously been reported …”
Section: Introductionmentioning
confidence: 91%
“…The magnesiothermic reduction has also been applied to silica glass substrates and quartz crystals . Gutman et al performed the reduction with magnesium powder via the solid‐state reaction at 500‐640°C and found that an intriguing structure is generated .…”
Section: Introductionmentioning
confidence: 99%
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