1999
DOI: 10.1002/(sici)1097-4555(199905)30:5<385::aid-jrs392>3.0.co;2-r
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Investigation of vibrational and photoluminescence spectra of nanocrystalline silicon by micro-Raman spectroscopy using various laser powers

Abstract: The Raman spectra of silicon nanocrystals embedded in silicon oxide and in porous silicon were measured at various laser powers. It was found that the Si-Si stretching Raman peak shifts to lower wavenumbers and broadens when the laser power increases. The effect is significant and reversible, i.e. the peak returns to its former position when the laser power is decreased to the initial level. It was found that this reversible phenomenon is caused by an increase in bond length due to the heating effect of the la… Show more

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Cited by 7 publications
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“…As in the case of figure 10(b), the phonon scattering spectrum on silicon nanocrystals is absent from the location where strong PL is available (figure 11). A relatively intense peak around 2200 cm −1 is attributed to silicon hydrides [20]. It is also observed in red-luminescent materials (figure 10(b)); however, the intensity is fairly weak due to fluorescence overlap.…”
Section: Raman Scattering Spectroscopy Of Red-and Green-luminescent M...mentioning
confidence: 83%
“…As in the case of figure 10(b), the phonon scattering spectrum on silicon nanocrystals is absent from the location where strong PL is available (figure 11). A relatively intense peak around 2200 cm −1 is attributed to silicon hydrides [20]. It is also observed in red-luminescent materials (figure 10(b)); however, the intensity is fairly weak due to fluorescence overlap.…”
Section: Raman Scattering Spectroscopy Of Red-and Green-luminescent M...mentioning
confidence: 83%