Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials 2013
DOI: 10.7567/ssdm.2013.ps-3-15
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Investigation of Tunneling FET Device Designs for Improving Circuit Switching Performance and Energy

Abstract: This paper investigates the device designs for improving the switching delay and dynamic switching energy in Tunneling FET (TFET) circuit including the Dual Gate Oxide (DOX), Drain-Side Underlap (Dund) and Dual Metal Work Function (DWF) techniques. The implications on the device characteristics and resulting impacts on the switching characteristic of TFET inverter are analyzed through detailed atomistic TCAD mixed-mode simulations. The effectiveness and relative merits of the DOX, Dund, and DWF techniques are … Show more

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Cited by 4 publications
(3 citation statements)
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“…(b) Enhanced Miller Capacitance: Normally, the total gate capacitance (C gg ) in a TFET is dominated by the drain component (C gd ). This is due to the band misalignment at the source channel interface and influence of V ds on the movement of carriers across the drain junction [93]. This increases the total Miller capacitance of the device and results in undesirable spikes in the transient characteristics of the implemented circuit thus creating a surge in the dynamic power dissipation.…”
Section: Synthesis Perspectivementioning
confidence: 99%
See 1 more Smart Citation
“…(b) Enhanced Miller Capacitance: Normally, the total gate capacitance (C gg ) in a TFET is dominated by the drain component (C gd ). This is due to the band misalignment at the source channel interface and influence of V ds on the movement of carriers across the drain junction [93]. This increases the total Miller capacitance of the device and results in undesirable spikes in the transient characteristics of the implemented circuit thus creating a surge in the dynamic power dissipation.…”
Section: Synthesis Perspectivementioning
confidence: 99%
“…To actualize p and n-TFETs with comparable drive strengths, the total Miller capacitance of the device must be considerably reduced by using gate engineering techniques. The use of hetero dielectric under the gate metal, known as Dual Oxide technique (DOX) [93] increases the total drain current (using high-K oxide near source) and solves the current degradation in the internal nodes while stacking (shown in figure 7 barrier at the drain and lowers gate-drain capacitance significantly [98]. The performance improvement can be seen in terms of energy delay product in figure 7(c).…”
Section: (C) Improved Complementary Tfet Designmentioning
confidence: 99%
“…From circuit point of view, the Miller capacitance of TFET device is of particular importance and should be reduced. In our previous study [8], the device design techniques for improving the device characteristic and reducing of TFET device are investigated. Among the techniques, the Dual Oxide (DOX) approach, where low-gate dielectric is used near the drain side to reduce the Miller capacitance, provides better improvements in both the delay and dynamic energy.…”
Section: Introductionmentioning
confidence: 99%