2010
DOI: 10.1016/j.optlastec.2010.02.007
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Investigation of transmittance property of Palladium thin films fabricated by pulsed laser deposition with polarization using single layer model

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Cited by 5 publications
(2 citation statements)
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References 32 publications
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“…These peaks observed in the XRD pattern indicate a high purity and crystallinity in the Pd film. Similar XRD results have been observed for Pd thin films that prepared with different method such as electroplating, pulse laser deposition, laser ablation, and sputtering [21][22][23][24].…”
Section: Optical Measurementssupporting
confidence: 79%
“…These peaks observed in the XRD pattern indicate a high purity and crystallinity in the Pd film. Similar XRD results have been observed for Pd thin films that prepared with different method such as electroplating, pulse laser deposition, laser ablation, and sputtering [21][22][23][24].…”
Section: Optical Measurementssupporting
confidence: 79%
“…Our Pd thin films were also shown by X-ray diffraction to exhibit a pronounced (111) texture, typical for vacuum deposited fcc metallic thin films. [20][21][22] Cu Ka radiation was used and the diffractograms were recorded with an angle step of 0.021. No secondary (200) peak was detected.…”
Section: Dkmentioning
confidence: 99%