2016 International Conference on Electronics Packaging (ICEP) 2016
DOI: 10.1109/icep.2016.7486771
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of thermal cycling maximum temperature effect on fatigue life of WLCSP

Abstract: The accelerated thermal cycling test is a standard method which is currently used to characterize the reliability performance of electronic packaging. The test vehicles are placed in a condition which is harsher than the actual usage condition in order to reduce the testing and development time. Recently, in order to further reduce the testing time, the ramping rate of thermal cycling test is increased, and the acceleration factor empirical model could be used to predict the fatigue life under different loadin… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2017
2017
2018
2018

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 9 publications
(7 reference statements)
0
0
0
Order By: Relevance