Investigation of the vibrational modes of ZnO grown by MOCVD on different orientation planes

Abstract

Wurtzite ZnO thin films were prepared on sapphire substrate by metal organic chemical vapor deposition (MOCVD). Raman scattering studies on different crystallographic textures were performed in the backscattering geometry, and polarization effect is investigated in different configurations z()prefix−prefix−truez¯ and x()prefix−prefix−truex¯. ZnO Raman modes are investigated in each texture. In the case of ZnO thin film deposed on r‐(11‐22) sapphire plane and using backscattering geometry, new Raman line was observed at 390 cm−1 because this mode has not been noticed in this geometry. It is shown that the frequencies of the quasi‐phonon modes of the examined thin film are in good agreement with the theoretical values calculated within the framework of Loudon model. Copyright © 2014 John Wiley & Sons, Ltd.

Recent advances in linear and non‐linear Raman spectroscopy. Part IX

“…presented an investigation of the vibrational modes of Wurtzite ZnO thin films prepared on sapphire substrate by metal organic chemical vapor deposition (MOCVD) on different orientation planes. They show that the frequencies of the quasi‐phonon modes of the thin films are in good agreement with the theoretical values calculated within the framework of Loudon model . Wojcieszak and colleagues described the origin of the variability of the mechanical properties of silk fibers by considering both order and crystallinity along silkworm and spider fibers.…”

Raman investigation of N‐implanted ZnO: Defects, disorder and recovery

“…The most intense PL peak at 3.313 eV is the famous FA (free electron to shallow but localized acceptors) transition in ZnO . However, there are other opinions also regarding the origin of this transition . Typical defect species associating both V Zn and V O s near the grain boundary region contribute to this PL emission even at room temperature .…”

Large-Area Deposition of MoS2 by Pulsed Laser Deposition with In Situ Thickness Control

“…The (*) represents the vibration modes E 1g (~379 cm -1 ) and A 1g (~416 cm -1 ) for the 9 sapphire substrate. 43 The variation of the intensity of these peaks can be evidence of little defects or our thin films. X-ray photoelectron spectroscopy (XPS) studies were further used to analyze the films after a subtle sputter-clean with Ar + ions.…”