2022
DOI: 10.1016/j.scriptamat.2022.114623
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of the surface optimization of β-Ga2O3 films assisted deposition by pulsed MOCVD

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2023
2023
2024
2024

Publication Types

Select...
3
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(2 citation statements)
references
References 19 publications
0
2
0
Order By: Relevance
“…In addition, it can aggravate the leakage current of the metal electrode. 29,30 Thus, the morphology of the surface of the α-Ga 2 O 3 epilayer is an important aspect of the material quality. Figure 3g− The AFM images reveal that the FME-grown α-Ga 2 O 3 film has a smoother surface compared to the reference α-Ga 2 O 3 film.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…In addition, it can aggravate the leakage current of the metal electrode. 29,30 Thus, the morphology of the surface of the α-Ga 2 O 3 epilayer is an important aspect of the material quality. Figure 3g− The AFM images reveal that the FME-grown α-Ga 2 O 3 film has a smoother surface compared to the reference α-Ga 2 O 3 film.…”
Section: ■ Results and Discussionmentioning
confidence: 99%
“…High surface roughness in an epilayer can cause increased carrier scattering and greatly reduce the mobility of the carriers. In addition, it can aggravate the leakage current of the metal electrode. , Thus, the morphology of the surface of the α-Ga 2 O 3 epilayer is an important aspect of the material quality. Figure g–i shows the AFM images and root-mean-square (RMS) values for thick α-Ga 2 O 3 films grown under different FME conditions as measured on a 5 × 5 μm 2 area.…”
Section: Resultsmentioning
confidence: 99%