Investigation of the Processes of Retention and Release of Implanted Deuterium and Helium Ions for Tungsten and Tantalum Coatings

Abstract

The analysis of main published results of studies of retention and migration of ion-implanted hydrogen isotopes and helium in tungsten and tantalum coatings, formation of radiation damages of the crystal lattice and their interaction with implanted gases, as well as the influence of helium and deuterium on various properties and surface morphology of coatings was carried out. The irradiation of samples was performed by beams of accelerated ions of hydrogen isotopes or He+, and in a plasma containing these ions, at various fluences and energies of incident ions, and at various temperatures of targets during implantation. Special attention was paid to the research results obtained at simultaneous irradiation of W both in bulk and in thin-film form. The used methods were electron microscopy, reemission mass spectrometry, thermal desorption spectrometry, X-ray photoelectron spectroscopy, X-ray diffraction, nuclear reaction analysis and Rutherford ion scattering.