2014
DOI: 10.1063/1.4868108
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Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

Abstract: Articles you may be interested inEffect of metal-ion doping on the optical properties of nanocrystalline ZnO thin films

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Cited by 261 publications
(229 citation statements)
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References 27 publications
(30 reference statements)
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“…Our extinction coefficient at 3 eV is ß3.4 (see Fig. S3 [38]), which is comparable with that (ß3.2) of Yim et al [32] for ultrathin CVD MoS 2 , but much lower than that (ß5.1) of Shen et al [24]. The higher coefficient could be a result of sample structural quality or the way it was extracted from their four-phase ellipsometric model, even though it contains all similar absorption peaks [24].…”
Section: Resultssupporting
confidence: 78%
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“…Our extinction coefficient at 3 eV is ß3.4 (see Fig. S3 [38]), which is comparable with that (ß3.2) of Yim et al [32] for ultrathin CVD MoS 2 , but much lower than that (ß5.1) of Shen et al [24]. The higher coefficient could be a result of sample structural quality or the way it was extracted from their four-phase ellipsometric model, even though it contains all similar absorption peaks [24].…”
Section: Resultssupporting
confidence: 78%
“…Recently, SE has also been used to determine the dielectric function of CVD-grown MoS 2 [28,29]. Yim et al [32] have found that, in their four-phase ellipsometric model, the refraction index (n) and the extinction coefficient (k) of their CVD MoS 2 exhibit a dependence on the MoS 2 film thickness. Shen et al [24], using terahertz (THz) absorption and SE, investigated the charge dynamics to show the semiconductor behavior and a blueshift of ß0.2 eV of charge transfer bands compared with those of the bulk material and also determine the dielectric function from 0.73 to 6.42 eV.…”
Section: Introductionmentioning
confidence: 99%
“…4c) likely arises from dielectric environment differences between bulk and single layer specimens. The extinction coefficient, k, in the region 3 to 4.5 eV is about ∼2.5…3.5, which is comparable with that (∼3.2) of Yim et al [14] for ultrathin CVD MoS 2 and with the data of Li et al [15] for TMDs, but much lower than that (∼5.1) of Shen et al [39]. The higher coefficient, k, could be a result of sample structural quality or the way it was extracted from their four-phase ellipsometric model [39].…”
Section: Resultssupporting
confidence: 76%
“…For optoelectronic device applications of TMDs monolayers to be fully understand, it is also necessary to know the complex refractive index and then to determine optical conductivity. Recently, we have employed the SE to investigate the optical constants of graphene [12,13], however, up to date, SE characterisation of 2D layered TMDs has rarely been reported [14][15][16]. Moreover, additional UV-visible-near-infrared absorption measurements can promote deepening the understanding of the optical response of 2D systems for successful nanooptical device engineering.…”
Section: Introductionmentioning
confidence: 99%
“…For this reason, detailed knowledge of the complex dielectric functions in dependence of the number of layers is highly desirable. Typical methods to extract the dielectric function are ellipsometry measurements under a certain angle of incidence to probe in-plane and out-of-plane components of the light matter interaction done with macroscopically large light spots [122][123][124] . The fabrication of flakes with a precise control over the number [48] .…”
Section: Complex Dielectric Function and Absorbance Of Tmdsmentioning
confidence: 99%