Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

Influence of scanning rate on quality of AFM image: Study of surface statistical metrics

“…One of the problems of such fields as photonics, nano‐magnetism, nanoelectronics is a problem of surface quality control. Reliable data of AFM contributes both preparation of new structures for electronics (Šik et al, ) and characterization of existing optoelectronic devises to improve their efficiency (Dallaeva, Tomanek, Skarvada, & Grmela, ; Skarvada et al, ).…”

Investigation of the I–V characteristics of n+/n homojunctions introduced by heavy ion irradiation in CdZnTe crystals

“…The exponential increase in leakage current at the irradiated surface is the result of this electrical injection. At the same Ion fluence (n cm −2 ) Net density (cm −3 ) Conduction type (n/p) 1 × 10 11 1.9 × 10 9 n 5 × 10 11 9 × 10 9 n 2.5 × 10 12 5.3 × 10 10 n 1 × 10 13 1.2 × 10 12 n 1.4 × 10 13 1.5 × 10 13 n time, the width of the depletion layer decreases, enhancing electron tunnelling so that the leakage current increases sequentially. The asymmetric I-V curves of the CdZnTe crystals were also obtained under other irradiation conditions.…”

“…[9][10][11] The interaction between low-energy heavy ions and CdZnTe crystals can modulate their electrical properties and surface structure. For example, O. Šik et al 12 passivated CdZnTe at a low dose of a 5 keV argon ion beam to reduce leakage current, and the best leakage current reduction effect was achieved at a dose of 1.4 × 10 16 n cm −2 . The results of Martínez-Herraiz et al 13 pointed out that the conversion of the surface conductance type of CdZnTe crystals could be achieved by changing the argon ion irradiation parameters and substrate temperature.…”