Proceedings of Canadian Conference on Electrical and Computer Engineering CCECE-94 1994
DOI: 10.1109/ccece.1994.405815
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of the characteristics of new HBT's under large signal excitation

Abstract: In this paper, HBT (Heterojunction Bipolar Transistor) gain measurements under large signal excitation at 14 and 28 GHz are reported. The measurement system uses active loads in order to obtain * Rockwell Intemationa1,Science center, Thousand Oaks,CA, USA. corresponding to the 1 dB compression point exitation for different transistors are shown in Figures 2 to 5. 570 CRC Ottawa, Tony Lavene and Somsack Sychaleun of Carleton University for their contribution.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 4 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?