Investigation of Temperature and Channel Dimension Effects on CMOS Circuit Performance
Zitouni Messai,
Abdelhalim Brahimi,
Okba Saidani
et al.
Abstract:This paper presents the impact of temperature variations and alterations in transistor channel dimensions on CMOS (Complementary Metal-Oxide-Semiconductor) circuit technology. To facilitate this investigation, we first identified critical parameters characterizing the device's performance, which could exhibit susceptibility to these influences. The analysis encompassed critical metrics such as the transfer characteristic, drain current, logic levels, inflection points, and truncation points. These parameters e… Show more
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