Investigation of surface morphology, optical and electronic properties of Mg2Si thin films on Si(111)
D. V. Fomin,
A. V. Polyakov,
K. N. Galkin
et al.
Abstract:The article presents the results of a study of the elemental composition, surface morphology, optical and electronic properties of Mg2Si thin films formed on Si (111). Both samples containing films were formed in layers by the method of reactive epitaxy, but at different heating temperatures of the substrates. The formed films consisting of alternating layers of Mg and Si at a ratio of 3:1, according to electron Auger spectroscopy, contain Mg and Si atoms in the associated layers. The Raman light scattering me… Show more
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