Abstract:In this letter, an experiment is designed to validate the soft ESD failure. The capacitive transimpedance amplifier (CTIA) circuit used in the hybrid integrated infrared sensor is chosen as the prototype for its characteristic of ESD-protection-device-free. The experiments show that under the ESD event with the rising pulse voltage, the induced leakage current in the CTIA circuit increase as well. As the pulse voltage exceeds one certain threshold point, the CTIA circuit fails to work anymore. The EMMI measure… Show more
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