Investigation of SIBM driven recrystallization in alpha Zirconium based on EBSD data and Monte Carlo modeling

Abstract

Abstract. The work focuses on the influence of moderate plastic deformation on subsequent partial recrystallization of hexagonal zirconium (Zr702). In the considered case, strain induced boundary migration (SIBM) is assumed to be the dominating recrystallization mechanism. This hypothesis is analyzed and tested in detail using experimental EBSD-OIM data and Monte Carlo computer simulations. An EBSD investigation is performed on zirconium samples, which were channel-die compressed in two perpendicular directions: normal direction (ND) and transverse direction (TD) of the initial material sheet. The maximal applied strain was below 17%. Then, samples were briefly annealed in order to achieve a partly recrystallized state. Obtained EBSD data were analyzed in terms of texture evolution associated with a microstructural characterization, including: kernel average misorientation (KAM), grain orientation spread (GOS), twinning, grain size distributions, description of grain boundary regions. In parallel, Monte Carlo Potts model combined with experimental microstructures was employed in order to verify two main recrystallization scenarios: SIBM driven growth from deformed sub-grains and classical growth of recrystallization nuclei. It is concluded that simulation results provided by the SIBM model are in a good agreement with experimental data in terms of texture as well as microstructural evolution.