2023
DOI: 10.1016/j.mtcomm.2023.105593
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of resistive switching properties in acceptor-induced Sr(Fe,Ti)O3 thin film memristor

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 38 publications
0
1
0
Order By: Relevance
“…GDYO-5 nm (Figure a–c) exhibits relations with the double logarithmic I – V plot in all four states from 0 V → 1 V→ 0 V→ −1 V → 0 V. which is well-matched with the Ohmic and space-charge-limited-conduction (SCLC) mechanisms. The SCLC mechanism relates to three portions of the Ohmic region ( I – V ), trap-unfilled region ( I – V 2 ), and trap-filled region, which are expressed as follows, respectively: ,, J Ohm = q n 0 μ V d J SCLC = 9 8 μ ε V 2 d 3 wherein J , q , n 0 , μ, θ, ε, V , and d are the current density, electric charge, free carrier concentration at equilibrium, mobility, density ratio between n 0 and total carriers, static dielectric constant, applied voltage, and thickness of the switching medium, respectively. In states (i) and (ii), Ohmic conduction (slope ∼ 1.12) covers the HRS state; meanwhile, SCLC conduction in response to switching the device from HRS to LRS (slope ∼ 1.86).…”
Section: Resultsmentioning
confidence: 99%
“…GDYO-5 nm (Figure a–c) exhibits relations with the double logarithmic I – V plot in all four states from 0 V → 1 V→ 0 V→ −1 V → 0 V. which is well-matched with the Ohmic and space-charge-limited-conduction (SCLC) mechanisms. The SCLC mechanism relates to three portions of the Ohmic region ( I – V ), trap-unfilled region ( I – V 2 ), and trap-filled region, which are expressed as follows, respectively: ,, J Ohm = q n 0 μ V d J SCLC = 9 8 μ ε V 2 d 3 wherein J , q , n 0 , μ, θ, ε, V , and d are the current density, electric charge, free carrier concentration at equilibrium, mobility, density ratio between n 0 and total carriers, static dielectric constant, applied voltage, and thickness of the switching medium, respectively. In states (i) and (ii), Ohmic conduction (slope ∼ 1.12) covers the HRS state; meanwhile, SCLC conduction in response to switching the device from HRS to LRS (slope ∼ 1.86).…”
Section: Resultsmentioning
confidence: 99%