2004
DOI: 10.1080/15421400490432623
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Investigation of Refractive Indices of Free-Standing Films by Ellipsometry

Abstract: The refractive indices of free-standing films (FSFs) of an antiferroelectric liquid crystal MHPOBC and a conventional smectic liquid crystal 8CB were studied by means of transmission and reflection ellipsometry. When the FSF thickness of MHPOBC is thicker than 260 nm, the refractive indices of FSFs appear to be the same as those of bulk smectic layers. In the case of thin FSFs of 8CB with a small numbers of layers, birefringence could not be obtained clearly by means of reflection ellipsometry.

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Cited by 4 publications
(2 citation statements)
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“…Now let us consider the obliquely incident light toward a thin liquid crystal film. 3) As is illustrated in Fig. 1, when a light beam with symmetric incident angles þ and À is incident on the thin film, the amplitude transmissivity of ppolarized light and s-polarized light T þ p ; T þ s and T À p ; T À s are represented by…”
Section: Eliminating the Effect Of Multiple-beam Interference On Tran...mentioning
confidence: 99%
“…Now let us consider the obliquely incident light toward a thin liquid crystal film. 3) As is illustrated in Fig. 1, when a light beam with symmetric incident angles þ and À is incident on the thin film, the amplitude transmissivity of ppolarized light and s-polarized light T þ p ; T þ s and T À p ; T À s are represented by…”
Section: Eliminating the Effect Of Multiple-beam Interference On Tran...mentioning
confidence: 99%
“…The incidence plane of the laser beam was the x-z plane (the zaxis along the layer normal, the y-axis along the electric field). 7,8)…”
Section: Principle and Measuring System Of The Experimentsmentioning
confidence: 99%