“…Table listed the short circuit current density ( J sc ), open circuit voltage ( V oc ), fill factor ( FF ), and conversion efficient ( η ) of these solar cells A, B, and C. It was found that the short circuit current density of 57.09 mA/cm 2 for solar cell B was larger than that of 50.82 mA/cm 2 for solar cell C. More surface recombination centers were induced on the as‐etched surface of solar cell C, because the etching process for removing the p + ‐GaSb layer caused damage to the p ‐GaSb surface. To reduce the induced surface recombination centers, the bias‐assisted PEC oxidation process was performed to form a PEC oxide layer on the p ‐GaSb surface as an oxide passivation layer after the etching process in solar cell B. Consequently, the interface state density between the PEC oxide passivation layer and the p ‐GaSb was reduced to decrease the carrier recombination on the surface of solar cell B. Therefore, the improvement in short circuit current density was attributed to that the surface carrier recombination in solar cell B was suppressed by the bias‐assisted PEC passivation function.…”