2017
DOI: 10.1038/ncomms14054
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Investigation of phonon coherence and backscattering using silicon nanomeshes

Abstract: Phonons can display both wave-like and particle-like behaviour during thermal transport. While thermal transport in silicon nanomeshes has been previously interpreted by phonon wave effects due to interference with periodic structures, as well as phonon particle effects including backscattering, the dominant mechanism responsible for thermal conductivity reductions below classical predictions still remains unclear. Here we isolate the wave-related coherence effects by comparing periodic and aperiodic nanomeshe… Show more

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Cited by 129 publications
(145 citation statements)
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“…Compared to the straight beam with w  = 75 nm, the tortuous beam with s  = 395 nm has 130 additional scattering corner sites. Following diffuse scattering from the boundary within the structures, these phonons scatter in the opposite direction of the dominant heat flow, resulting in a reduction of MFP 22 .…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Compared to the straight beam with w  = 75 nm, the tortuous beam with s  = 395 nm has 130 additional scattering corner sites. Following diffuse scattering from the boundary within the structures, these phonons scatter in the opposite direction of the dominant heat flow, resulting in a reduction of MFP 22 .…”
Section: Resultsmentioning
confidence: 99%
“…All of the measurements are performed under vacuum to minimize convective heat losses from the beams, and the heat loss through radiation is considered negligible compared to the heat conduction through the samples at all temperatures in the study 31 . The thermal interfacial resistances between the sample and the platforms are negligible since the devices are monolithically fabricated, which minimizes contact resistances 13, 22, 32 . The uncertainty is primarily due to the measurement of the sample dimensions, and the uncertainty propagation is available in Supplementary Information.
Figure 2Scanning electron microscope (SEM) images of the measurement structure with false-colored serpentine heater/thermometers.
…”
Section: Introductionmentioning
confidence: 99%
“…In that case, what is constant is the surface roughness (Δrms). Here we use a constant p, and the rationale behind studies which use constant Δrms versus constant p 31,48,60,61,62,63,64 is that the microscopic details of phonon scattering at interfaces are poorly understood anyway. 64 However, either way gives vary similar results without any qualitative or quantitative differences in disordered structures.…”
Section: Approachmentioning
confidence: 99%
“…[77] A limiting factor is that the size and the spacing of the pores in experiments is usually one order of magnitude larger than that studied in atomistic simulations and the κ p reduction is not as drastic. [78,79,80] In np-Si κ p reduction originates from modified phonon dispersion relations, and the geometry and size of the pores can be designed to get κ p < 1 Wm −1 K −1 at reasonably low porosity (30%). [81] Similarly to what observed for nanostructures, a layer of amorphous material at the pore surface enhances the reduction of κ p .…”
Section: Nanoporous Silicon and Sige Heterostructuresmentioning
confidence: 99%