2007
DOI: 10.1088/0256-307x/24/7/089
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Investigation of Oxygen Vacancy and Interstitial Oxygen Defects in ZnO Films by Photoluminescence and X-Ray Photoelectron Spectroscopy

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Cited by 199 publications
(55 citation statements)
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“…The spectrum revealed a peak at 3.28 eV related with band-edge emission [18]. As a matter of fact, the intensity of band-edge emission is directly related with the quality of grown film [19]. Most of the oxygen vacancy related defects are compensated with incoming oxygen as the annealing temperature increases from 500 to 800…”
Section: Pl Measurementsmentioning
confidence: 99%
“…The spectrum revealed a peak at 3.28 eV related with band-edge emission [18]. As a matter of fact, the intensity of band-edge emission is directly related with the quality of grown film [19]. Most of the oxygen vacancy related defects are compensated with incoming oxygen as the annealing temperature increases from 500 to 800…”
Section: Pl Measurementsmentioning
confidence: 99%
“…The effect of annealing on the native defects of ZnO has been studied extensively and it has been demonstrated that the crystallinity of ZnO can be improved by annealing the samples at higher temperatures, typically above 500 °C [1620]. However, some studies show that annealing at higher temperatures can also introduce defects, such as oxygen interstitials in the ZnO lattice [2122]. …”
Section: Introductionmentioning
confidence: 99%
“…Using XPS, we were able to identify both oxygen vacancies [17,70,71] and adsorbed water [72][73][74] on the surface of the catalyst as seen from the O1s peak of our photocatalyst after the photomethanation test ( Figure S8, Supporting Information). Then CO 2 interacts with hydroxyl groups to form intermediates such as formates, carbonates, and bicarbonates, which lead to the final methane product.…”
Section: Resultsmentioning
confidence: 99%