2019
DOI: 10.1002/pssa.201970069
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Investigation of Ion Channeling and Scattering for Single‐Ion Implantation with High Spatial Resolution

Abstract: Ion Channeling and ScatteringA nanoaperture defined by drilling in a hollow pyramidal atomic force microscope (AFM) tip is used to produce precise nitrogen vacancy (NV) center nanostructures in diamond by low energy nitrogen implantation. Ion scattering and channeling are the most important limiting factors to achieve high lateral resolution. In article number http://doi.wiley.com/10.1002/pssa.201900528 by Nicole Raatz and co‐workers, both effects are studied using iradina, crystal‐trim and corresponding exper… Show more

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Cited by 4 publications
(4 citation statements)
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“…In these simulations the target material is usually assumed to be amorphous. If the ion travels through a highsymmetry direction of a crystalline material, channeling could occur [17], and the range of the ions is both longer (in average) and more dispersed than in the amorphous case. Channeling can be avoided either by inclining the sample with respect to the beam direction, in a way to avoid implantation through highly symmetric directions, or (for low-energy implantations) by depositing on the sample a thin amorphous metal layer, to make the ions enter the sample through casual directions.…”
Section: Implantation and Post Annealing Implantation Principlesmentioning
confidence: 99%
“…In these simulations the target material is usually assumed to be amorphous. If the ion travels through a highsymmetry direction of a crystalline material, channeling could occur [17], and the range of the ions is both longer (in average) and more dispersed than in the amorphous case. Channeling can be avoided either by inclining the sample with respect to the beam direction, in a way to avoid implantation through highly symmetric directions, or (for low-energy implantations) by depositing on the sample a thin amorphous metal layer, to make the ions enter the sample through casual directions.…”
Section: Implantation and Post Annealing Implantation Principlesmentioning
confidence: 99%
“…To achieve such high location precision, various methods have been investigated to control the position and distance between NV centers in diamond. , These methods can be classified into molecular ion implantation, , single-ion implantation via an atomic force microscope (AFM) tip hole, and ion implantation with a blocking mask. , In molecular implantation, an ionized species such as N 2 + or a molecule with multiple nitrogen atoms is implanted into diamond. This method has the advantage of generating closely located NVs with high probability, yet the extent to which scalability can be increased is limited by the number of nitrogen atoms in one molecule.…”
mentioning
confidence: 99%
“…The low average T 2,Hahn value of 4.5 μs is presumably because of the shallow NV implantation effect, which is led by ions being scattered from the remaining e-beam resist layer. This problem can be resolved by using an SOI wafer mask and a transfer method, implantation with the pierced AFM tip method, or combining EBL with a dry-etching process …”
mentioning
confidence: 99%
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