2012
DOI: 10.1002/fuce.201200063
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Investigation of Impactors on Cell Degradation Inside Planar SOFC Stacks

Abstract: The impactors on cell degradation inside planar SOFC stacks were investigated using both coated and uncoated Fe–16Cr alloys as the interconnects under stable operating conditions at 750 °C and thermal cycling conditions from 750 to 200 °C. It was found that cell degradation inside the stack is primarily dependent on the interfacial contact between the cathode current‐collecting layer and the interconnect. Additionally, cell degradation is found to be independent of the high‐temperature oxidation and Cr vaporiz… Show more

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Cited by 30 publications
(8 citation statements)
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“…The proportion of the voltage drop of anode support 1 accounting to the total voltage drop of stack 1 was higher than that of anode support 2 to stack 2. This phenomenon resulted from the improvement of the cathode–interconnect contact, which offsets part of the anode degradation in accordance with our previous reports 22, 23.…”
Section: Resultssupporting
confidence: 92%
“…The proportion of the voltage drop of anode support 1 accounting to the total voltage drop of stack 1 was higher than that of anode support 2 to stack 2. This phenomenon resulted from the improvement of the cathode–interconnect contact, which offsets part of the anode degradation in accordance with our previous reports 22, 23.…”
Section: Resultssupporting
confidence: 92%
“…Therefore, the oxygen reduction reaction in the cathode tripe-phase boundaries has more electrons from the interconnect, causing a substantial increase in cell performance. It was also found that cell degradation inside the stack, is principally dependent on the interfacial contact between the cathode current collecting layer and the interconnect [7].…”
Section: Introductionmentioning
confidence: 99%
“…[11][12][13] Furthermore, the quantitative contributions of the resistance sources of components to stack performance were obtained by our group. We concluded that stack performance is signifi cantly affected by cell performance itself when excellent stack sealing and contact among internal components are provided.…”
mentioning
confidence: 99%