An accurate prediction of spacecraft avionics single event effect (SEE) radiationsusceptibility is key to ensuring a safe and reliable vehicle. This is particularly important for long-duration deep space missions for human exploration where there is little or no chance for a quick emergency return to Earth. Monte Carlo nuclear reaction and transport codes such as FLUKA 12 can be used to generate very accurate models of the expected in-flight radiation environment for SEE analyses. A major downside to using a Monte Carlo-based code is that the run times can be very long (on the order of days). A more popular choice for SEE 1 calculations is the CREME96 3 deterministic code, which offers significantly shorter run times (on the order of seconds). However, CREME96, though fast and easy to use, has not been updated in several years and underestimates secondary particle shower effects in spacecraft structural shielding mass. Another modeling option to consider is the deterministic code HZETRN 2010 4 , which includes updates to address secondary particle shower effects more accurately. This paper builds on previous work by Rojdev, et al. 5 to compare the use of HZETRN 2010 against CREME96 as a tool to verify spacecraft avionics system reliability in a space flight SEE environment. This paper will discuss modifications made to HZETRN 2010 to improve its performance for calculating SEE rates and compare results with both in-flight SEE rates and other calculation methods.
Nomenclature
AP8MIN= integral proton flux for low Earth orbit during solar minimum CREME = Cosmic Ray Effects on Microelectronics FLUKA = FLUktuierende KAskade g/cm 2 = areal density; measure of thickness in radiation calculations GCR = Galactic Cosmic Ray GEO = Geostationary orbit HUP = a CREME96 program module that evaluates direct-ionization induced SEEs HZETRN = High-Charge and Energy Transport IIS = Stopping power variable keV/m = Unit of LET 2 km = kilometers LEO = Low Earth Orbit LET = Linear Energy Transfer MeV-cm 2 /g = Unit of LET normalized for a silicon sensitive volume SEE = Single Event Effect SEU = Single Event Upset Z = Atomic Number