Investigation of Gas Degradation in CO₂–N₂ Pulse Discharges II. Origin and Influence of Highly Attaching Species

Abstract

The mechanism of plasma resistance increase found in sealed C02-N2 discharges has been analyzed. From the various species occuring in such discharges only oxides of nitrogen seem to be suitable candidates. Indeed the degradation process can be simulated by adding a certain amount of N20. The failure in detection of these contaminants in naturally degraded mixtures suggests the involvement of complex molecular species depending strongly on the discharge conditions.