2012
DOI: 10.1117/12.916499
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Investigation of EUV haze defect: molecular behaviors of mask cleaning chemicals on EUV mask surfaces

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Cited by 2 publications
(3 citation statements)
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“…Figure 4 compares the measured conductivity values of NH 4 OH diluted in water to a mixture of Chemistry A in water for different concentrations. It is interesting to notice that Chemistry A gives similar conductivity values as NH 4 OH, but at much lower concentration (about 70x lower). This is because the dissociation rate of Chemistry A in H 2 O is much higher than that of NH 4 OH.…”
Section: Ionization (Conductivity Ph and Zeta Potential)mentioning
confidence: 87%
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“…Figure 4 compares the measured conductivity values of NH 4 OH diluted in water to a mixture of Chemistry A in water for different concentrations. It is interesting to notice that Chemistry A gives similar conductivity values as NH 4 OH, but at much lower concentration (about 70x lower). This is because the dissociation rate of Chemistry A in H 2 O is much higher than that of NH 4 OH.…”
Section: Ionization (Conductivity Ph and Zeta Potential)mentioning
confidence: 87%
“…DI water used for the tests is de-gassed before it was supplied to the cleaning chemical distribution system. Chemicals (NH 4 …”
Section: Process Parametersmentioning
confidence: 99%
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