Investigation of electronic transport in InAs/GaAs samples. A study using the metaheuristic self-adaptive differential evolution method

Ribeiro, Luiz Henrique Marra da Silva; Ider, João; Oliveira, Adhimar Flávio; Rubinger, R. M.; Rubinger, C. P. L.; Oliveira, A. G. de

doi:10.1016/j.physb.2021.413293

Cited by 1 publication

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“…Using non-destructive reflectance measurements through a UV-VIS-NIR spectrometer and then modeling the data with theoretical predictions that depend on the refractive indices belonging to the air/film/substrate set and the film thickness (Rubinger et al 2015, Jesus et al 2021). Thus, we present the results of modeling reflectance measurements using the cross-entropy (CE) global optimization method (Oliveira et al 2016, Ribeiro et al 2021) and discuss the results obtained for a homogeneous SiO2 film and its respective refractive index under different oxidation conditions. This being an experimental research that the methodology presented in Pereira et al (2018)…”

Section: Introductionmentioning

confidence: 99%

Determination of thickness and refractive index of SiO2 thin films using the cross-entropy global optimization method

Zaccaro

Oliveira

Rubinger

et al. 2021

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Silicon dioxide (SiO2) is a material that is abundant in nature and has wide application in semiconductor and insulating devices. In this work, a set of six SiO2 samples were grown on a Sigma-Aldrich Silicon substrate, varying the growth time and temperature. This set of samples were grown using times of 10 and 12h and temperatures of 800, 900, and 1000 ºC, under ambient atmosphere. After film growth, reflectance measurements were performed on the films and the substrate, using the Stellarnet UV-VIS-NIR spectrophotometer between 194 and 1081.5 nm. These measurements were modeled using a global optimization method, called Cross-entropy, together with the Bootstrapping resampling technique, seeking to robustly and statistically determine the thin film refractive index as a function of the wavelength and its thickness. To estimate the refractive index of the SiO2 thin film, the Cauchy model was used. For the substrate, reflectance measurements were used. The method proved to be efficient, presenting thickness values that were validated according to growth parameters and literature data. This method proved to be an important and low-cost tool, compared to traditional methods, to help in the steps of building thin films for semiconductor and insulating devices, thus improving their physical properties and enabling the development of new devices.

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Section: Introductionmentioning

confidence: 99%