Abstract:The direct replication of a periodic W/Si multilayer was investigated systematically. The W/Si multilayer was deposited by a high vacuum dc magnetron sputtering system. After deposition, the multilayer was transferred from the supersmooth mandrel onto a commercially available float glass substrate by the epoxy replication technique. The multilayer was characterized by the grazing incident x-ray reflectance (GIXR) measurement, atomic force microscope (AFM), and Zygo GPI interferometer before and after replicati… Show more
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