2024
DOI: 10.1007/s10854-024-12077-7
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of dielectric and electric modulus properties of Al/p-Si structures with pure, 3%, and 5% (graphene:PVA) by impedance spectroscopy

Merve Yürekli,
Ahmet Faruk Özdemir,
Şemsettin Altındal

Abstract: The Z–V measurements were performed in wide-range voltage (± 6 V), and then the real/imaginary parts of ε* (ε′, ε″), M* (M′, M″), Z* (Z′, Z″), tanδ, and σac values of the Al/p-Si structure with pure polyvinyl alcohol (PVA) (D1), 3% (D2), and 5% (D3) graphene-doped PVA interfacial-layer were calculated at four frequencies (1, 10, 100, and 1000 kHz). When the frequency in D2 and D3 structures was increased from 1 kHz to 1 MHz, the dielectric constant value changed from 32.47 to 5.12 and from 26.26 to 1.00, respe… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

1
0
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 33 publications
1
0
0
Order By: Relevance
“…Similar results were also reported in the literature by various researches in recently on the interfacial layer effects on the performance these devices [36][37][38].…”
Section: Dielectric Propertiessupporting
confidence: 91%
“…Similar results were also reported in the literature by various researches in recently on the interfacial layer effects on the performance these devices [36][37][38].…”
Section: Dielectric Propertiessupporting
confidence: 91%