Investigation of degradation dynamics of 265 nm LEDs assisted by EL measurements and numerical simulations
Francesco Piva,
Matteo Buffolo,
Nicola Roccato
et al.
Abstract:We studied four AlGaN-based 265 nm LEDs with increasing QW thickness (1.4 nm, 3 nm, 6 nm, and 9 nm) during a constant current stress at 100 A cm-2. We focused our attention on the parasitic components of the emission spectra at low current levels, and on the optical power recovery observed at high current levels. We associated every parasitic peak or band to a region in the device where they can be generated, also demonstrating if they are related to band-to-band emission or radiative emission through defects.… Show more
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