2013 Transducers &Amp; Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems 2013
DOI: 10.1109/transducers.2013.6627267
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of boron and nitrogen ion beam implantation in gold thin films for ohmic MEMS switch contact improvement

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2016
2016
2016
2016

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
(1 citation statement)
references
References 24 publications
0
1
0
Order By: Relevance
“…An interesting approach for leveraging the high conductivity of Au while improving its mechanical properties was discussed and demonstrated by Arazzat et al [128]. They showed that shallow ion implantation of boron and nitrogen on Au thin film can increase the surface hardness of the contact while not having a significant impact on the contact resistance.…”
Section: Selection Of Contact Materialsmentioning
confidence: 99%
“…An interesting approach for leveraging the high conductivity of Au while improving its mechanical properties was discussed and demonstrated by Arazzat et al [128]. They showed that shallow ion implantation of boron and nitrogen on Au thin film can increase the surface hardness of the contact while not having a significant impact on the contact resistance.…”
Section: Selection Of Contact Materialsmentioning
confidence: 99%