Novel in-Plane Semiconductor Lasers XXI 2022
DOI: 10.1117/12.2609420
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Investigation of astigmatism in tapered edge-emitting diode amplifiers at 980 nm

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“…To investigate the beam quality in the slow axis of our DBR-TPL we used the method of the moving slit. We recorded the intensity profiles of the near field (intensity at the facet), (virtual) beam waist 26 , and far field of the DBR-TPL at different power levels. Fig.…”
Section: Beam Characteristicsmentioning
confidence: 99%
“…To investigate the beam quality in the slow axis of our DBR-TPL we used the method of the moving slit. We recorded the intensity profiles of the near field (intensity at the facet), (virtual) beam waist 26 , and far field of the DBR-TPL at different power levels. Fig.…”
Section: Beam Characteristicsmentioning
confidence: 99%