2010
DOI: 10.1587/transele.e93.c.514
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Investigation of Adjustable Current-Voltage Characteristics and Hysteresis Phenomena for Multiple-Peak Negative Differential Resistance Circuit

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Cited by 3 publications
(1 citation statement)
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“…Once voltage reaches threshold voltage V th , there is a sharp decrease in voltage accompanied by rapid increase in current until it stabilizes at low resistance state indicating amorphous to crystalline transition of film occurs. This negative resistance phenomenon can be observed from the figure, the threshold voltages of the film in flat state, bent state and after being subjected to 1000 bending cycles are 1.05, 2.02 and 2.25 V respectively, which means that bending will increase the operating power consumption of the device 50 . Figure 5d, e, and f show the R-V curves of the PCM device based on the flexible [Ge(5 nm)/Sb(5 nm)] 8 multilayer film on PEEK substrate in flat state, bending state, and after bending 1000 times, respectively.…”
Section: Resultsmentioning
confidence: 83%
“…Once voltage reaches threshold voltage V th , there is a sharp decrease in voltage accompanied by rapid increase in current until it stabilizes at low resistance state indicating amorphous to crystalline transition of film occurs. This negative resistance phenomenon can be observed from the figure, the threshold voltages of the film in flat state, bent state and after being subjected to 1000 bending cycles are 1.05, 2.02 and 2.25 V respectively, which means that bending will increase the operating power consumption of the device 50 . Figure 5d, e, and f show the R-V curves of the PCM device based on the flexible [Ge(5 nm)/Sb(5 nm)] 8 multilayer film on PEEK substrate in flat state, bending state, and after bending 1000 times, respectively.…”
Section: Resultsmentioning
confidence: 83%