Investigation Into the Degradation of DDR4 DRAM Owing to Total Ionizing Dose Effects
Gyeongyeop Lee,
Minki Suh,
Minsang Ryu
et al.
Abstract:Total ionizing dose (TID) effects of gamma rays were investigated on DDR4 dynamic random access memory (DRAM) and analyzed using TCAD simulations. In this study, we considered the operating states, dose rates, temperatures, and annealing to analyze the impact of TID under different conditions. The worst degradation was observed in the operated state and at a low-dose rate because of the absence of an electrostatic barrier that reduced the possibility of interface trap formation under unbiased and high-dose rat… Show more
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