2021
DOI: 10.1088/1361-6528/abeb99
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Investigation into surface composition of nitrogen-doped niobium for superconducting RF cavities

Abstract: Systematic analysis of the surface morphology, crystalline phase, chemical composition and elemental distribution along depth for nitrogen-doped niobium was carried out using different methods of characterization, including Scanning Electron Microscopy (SEM), Atomic-Force Microscopy (AFM), Grazing Incidence X-ray Diffraction (GIXRD), Rutherford Backscattering Spectrometry (RBS) and layer-by-layer X-ray Photoelectron Spectroscopy (XPS) analysis. The results showed that, after nitrogen doping, the surface was co… Show more

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Cited by 4 publications
(4 citation statements)
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“…Here XPS provides information about the chemical composition of the surface oxide layer while STM/STS probes the quasiparticle density of states, the superconducting gap, subgap states, as well as their spatial inhomogeneity (Lechner et al, 2020). The samples' surface was characterized with a scanning electron microscope (SEM) for any evidence of defects such as etch pits (Zhao et al, 2010) or scarring due to hydrides (Barkov et al, 2013) or nitrides (Trenikhina et al, 2015;Dangwal Pandey et al, 2018;Dhakal et al, 2019;Spradlin et al, 2019;Yang et al, 2021).…”
mentioning
confidence: 99%
“…Here XPS provides information about the chemical composition of the surface oxide layer while STM/STS probes the quasiparticle density of states, the superconducting gap, subgap states, as well as their spatial inhomogeneity (Lechner et al, 2020). The samples' surface was characterized with a scanning electron microscope (SEM) for any evidence of defects such as etch pits (Zhao et al, 2010) or scarring due to hydrides (Barkov et al, 2013) or nitrides (Trenikhina et al, 2015;Dangwal Pandey et al, 2018;Dhakal et al, 2019;Spradlin et al, 2019;Yang et al, 2021).…”
mentioning
confidence: 99%
“…To have better understanding of chemical bonds in the deposited C-N films, high-resolution XPS (HR-XPS) with a scanning step size of 0.1 eV was carried out for W_CN and the results are shown in figure 6, which gives both the original test data and the peak fitting results. The rules of peak fitting using Multipak software can be found in our previously reported paper [27]. An area constraint of 4:3 was applied to the spinorbit doublets of the W 4f 7/2 and W 4f 5/2 energy levels and their binding energies (BEs) were set apart for 2.18 eV.…”
Section: Element and Chemical States Characterizationmentioning
confidence: 99%
“…The measured sputtering rate of SiO 2 is about 4.76 nm min −1 and the derived sputtering rate of Si is 5.04 nm min −1 . Details of the measurement process can be found in the supplemental file of [27].…”
Section: Element and Chemical States Characterizationmentioning
confidence: 99%
“…However, in practical terms, the pure Nb cavity is approaching its fundamental limit in terms of the magnetic flux entry field B sh [19][20][21], and it is highly desirable to have materials with better performance than Nb to make the SRF cavity [2,9]. In order to improve the peak magnetic field or quality factor of a Nb cavity, some treatments have been carried out, such as the so-called International Linear Collider (ILC)recipe with the combination of the electro-polishing and baking at 120 • C for 48 h [22][23][24][25], nitrogen-doping [26][27][28][29], nitrogen-infusion [21,30], Nb 3 Sn coating [31][32][33], rare earth elements doping [34], etc. Some ideas for achieving higher energy barrier of flux entry were also proposed [2].…”
Section: Introductionmentioning
confidence: 99%