2007
DOI: 10.4028/www.scientific.net/ddf.264.13
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Investigating Interdiffusion in Mo/V Multilayers from X-Ray Scattering and Kinetic Simulations

Abstract: In order to investigate interdiffusion in Mo/V multilayers, we present a method that combines both kinetic mean-field simulations and calculations of x-ray scattered intensity with disorder effects. Considering preliminary experimental data obtained on Mo(4nm)/V(2nm) multilayers, we show that the angular shift of spectra observed after annealing, should take place for both Fickian and asymmetric interdiffusion modes. In contrast, clear signatures of the interdiffusion modes are found from the simulation of the… Show more

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“…From this macroscopic elastic-like behavior of the multilayers during the intermixing kinetics, it is difficult to extract any information on the interdiffusion mode taking place. 40 Besides, one can show that the influence of the variation of d on the intensity of the satellite peaks is not significant. 41 In the following, we will consider d as constant, and focus on the satellite intensities instead of the angular position of the diffraction pattern.…”
mentioning
confidence: 99%
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“…From this macroscopic elastic-like behavior of the multilayers during the intermixing kinetics, it is difficult to extract any information on the interdiffusion mode taking place. 40 Besides, one can show that the influence of the variation of d on the intensity of the satellite peaks is not significant. 41 In the following, we will consider d as constant, and focus on the satellite intensities instead of the angular position of the diffraction pattern.…”
mentioning
confidence: 99%
“…This signature appearing in the calculation of the x-ray scattered intensity is the result of a subtle interplay between the strain effect, the initial composition profile and its evolution with time in the calculation of the x-ray scattered intensity. 40 The presence of strain is necessary to observe nonidentical I 2 (t) and I −2 (t) satellites. The nonsymmetrical initial composition profile is also desirable to get significant initial intensity peaks [I 2 (0) and I −2 (0)] on the diffraction pattern.…”
mentioning
confidence: 99%