Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy

Müller, Martin; Hývl, Matěj; Kratzer, Markus; Teichert, Christian; Misra, Soumyadeep; Yu, Linwei; Cabarrocas, Pere Roca i; Itoh, Takashi; Hájková, Zdeňka; Vetushka, Aliaksei; Ledinský, Martin; Kočka, J.; Fejfar, A.

doi:10.7567/jjap.54.08ka08

Cited by 7 publications

(6 citation statements)

References 25 publications

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“…C-AFM was previously used to study photovoltaic materials 23,24 as well as mix-phased Si thin films. 25,26 This advanced AFM technique uses a conductive tip to measure the current map in high spatial resolution on the biased sample surface.…”

Section: Methodsmentioning

confidence: 99%

“…C-AFM was previously used to study photovoltaic materials , as well as mix-phased Si thin films. , This advanced AFM technique uses a conductive tip to measure the current map in high spatial resolution on the biased sample surface. To convert the measured C-AFM current signal into local sample resistivity via Ohm’s law, it is necessary to uncouple it from the tip–sample contact resistance , and other artifacts. , This can be achieved by applying high tip–sample forces during the measurement.…”

Section: Experimental Sectionmentioning

confidence: 99%

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Nanoscale Study of the Hole-Selective Passivating Contacts with High Thermal Budget Using C-AFM Tomography

Hývl

Nogay

Löper

et al. 2021

ACS Appl. Mater. Interfaces

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We investigate hole-selective passivating contacts that consist of an interfacial layer of silicon oxide (SiO x ) and a layer of boron-doped SiC x (p). The fabrication process of these contacts involves an annealing step at temperatures above 750 °C which crystallizes the initially amorphous layer and diffuses dopants across the interfacial oxide into the wafer to facilitate charge transport, but it can also disrupt the SiO x layer necessary for wafer-surface passivation. To investigate the transport mechanism of the charge carriers through the selective contact and its changes during the annealing process, we utilize various characterization methods, such as transmission electron microscopy, micro Raman spectroscopy, and conductive atomic force microscopy. Combining the latter with a sequential removal of material, we assemble a tomographic reconstruction of the crystallized layer that reveals the presence of preferential vertical transport channels.

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Section: Methodsmentioning

confidence: 99%

Section: Experimental Sectionmentioning

confidence: 99%

Nanoscale Study of the Hole-Selective Passivating Contacts with High Thermal Budget Using C-AFM Tomography

Hývl

Nogay

Löper

et al. 2021

ACS Appl. Mater. Interfaces

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“…Recently, local properties of solar cells and materials used in solar cells have been evaluated using SPM techniques. [18][19][20][21][22][23][24] We have also developed a new technique to evaluate local photovoltaic properties of solar cells using SPM techniques. [25][26][27][28] Kelvin force microscopy (KFM) is one of the SPM techniques.…”

Section: Introductionmentioning

confidence: 99%

Estimation of local built-in potential of amorphous silicon thin-film solar cells by Kelvin force microscopy

Itoh

Ito

Kuriyama

et al. 2016

Jpn. J. Appl. Phys.

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The local surface potential of pin-type hydrogenated amorphous silicon (a-Si:H) thin-film solar cells has been evaluated by Kelvin force microscopy (KFM). We have also estimated the local built-in potential of the solar cells by KFM. In the surface morphology image of the solar cells, large convex grains related to the textured structure of the substrate were found. The surface potential distribution related to the surface morphology was observed in the solar cells. A similar surface potential distribution was also found in an n-type hydrogenated microcrystalline Si (µc-Si:H) film. The surface potential of the solar cells was not the same as that of the n-type film. The difference in average surface potential between the n-type hydrogenated microcrystalline Si (µc-Si:H) film and the solar cells increased with increasing built-in potential. The difference in local surface potential on large convex grains was smaller than that in the region between the large convex grains.

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“…Recently, the local properties of solar cells and materials used in solar cells have been evaluated by SPM techniques. [13][14][15][16][17][18][19] We have also developed a new technique to evaluate the local photovoltaic performance of solar cells by SPM techniques. [20][21][22][23] Kelvin force microscopy (KFM) is one of the SPM techniques.…”

Section: Introductionmentioning

confidence: 99%

Local surface potential on hydrogenated microcrystalline silicon films

Itoh

Sakai

Ito

et al. 2015

Jpn. J. Appl. Phys.

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The local surface potential on hydrogenated microcrystalline silicon films was investigated using a Kelvin force microscope. In the surface morphology image of the films deposited on Asahi U-type substrates, large and small convex grains were observed. In i-type films, the surface potentials on the large and small convex grains were higher than those in the concave regions between large convex grains and between small convex grains, respectively. The potential difference between a large grain and the region between large grains was larger than that between a small grain and the region between small grains. The surface potential distribution on p-type films showed the same tendency as that on the i-type films. On the other hand, the surface potential distribution on n-type films showed a reverse tendency to that on the i-type films. The potential difference between a large convex grain and the region between large convex grains depended on the doping ratio and that in the p-type films was smaller than that in the n-type films.

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Investigating inhomogeneous electronic properties of radial junction solar cells using correlative microscopy

Abstract: International audienc

Cited by 7 publications

References 25 publications

Nanoscale Study of the Hole-Selective Passivating Contacts with High Thermal Budget Using C-AFM Tomography

Nanoscale Study of the Hole-Selective Passivating Contacts with High Thermal Budget Using C-AFM Tomography

Estimation of local built-in potential of amorphous silicon thin-film solar cells by Kelvin force microscopy

Local surface potential on hydrogenated microcrystalline silicon films

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