Investigating Degradation Modes in Zn-AgO Aqueous Batteries with $\textit{In-Situ}$ X-ray Micro Computed Tomography

Scharf, Jonathan; Li, Yin; Redquest, Christopher; Liu, Ruixiao; Quinn, Xueying L.; Ortega, Jeff; Xia, Wei; Wang, Joseph; Doux, Jean-Marie; Meng, Ying Shirley

doi:10.48550/arxiv.2105.03411

2021

DOI: 10.48550/arxiv.2105.03411

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Investigating Degradation Modes in Zn-AgO Aqueous Batteries with $\textit{In-Situ}$ X-ray Micro Computed Tomography

Jonathan Scharf¹,

Yin Li²,

Christopher Redquest³

et al.

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Investigating Degradation Modes in Zn-AgO Aqueous Batteries with $\textit{In-Situ}$ X-ray Micro Computed Tomography

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