2012
DOI: 10.1117/12.919565
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Inversion and classification studies of live-site production-level MetalMapper data sets

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“…The JD technique for EMI data analysis and target classification was developed for TEMTADS [6] and then extended to all next-generation EMI sensors [21]. Advanced EMI sensors currently feature multi-axis illumination of targets and triaxial vector sensing, or exploit multi-static array data acquisition [6], [22].…”
Section: Joint Diagonalization Technique For Survey Datamentioning
confidence: 99%
“…The JD technique for EMI data analysis and target classification was developed for TEMTADS [6] and then extended to all next-generation EMI sensors [21]. Advanced EMI sensors currently feature multi-axis illumination of targets and triaxial vector sensing, or exploit multi-static array data acquisition [6], [22].…”
Section: Joint Diagonalization Technique For Survey Datamentioning
confidence: 99%