Intra-Rater and Inter-Rater Reliability of Brain Surface Intensity Model (BSIM)-Based Cortical Thickness Analysis Using 3T MRI

Jeon, Ji Young; Moon, Won‐Jin; Moon, Yeonsil; Han, Seol‐Heui

doi:10.13104/imri.2015.19.3.168

Investig Magn Reson Imaging

2015

DOI: 10.13104/imri.2015.19.3.168

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Intra-Rater and Inter-Rater Reliability of Brain Surface Intensity Model (BSIM)-Based Cortical Thickness Analysis Using 3T MRI

Ji Young Jeon

Won‐Jin Moon

Yeonsil Moon

et al.

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Intra-Rater and Inter-Rater Reliability of Brain Surface Intensity Model (BSIM)-Based Cortical Thickness Analysis Using 3T MRI

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