Interval statistic based reliability analysis method on small sample hot test of satellite thruster

Cui, Yi; Zhang, Yongbo; Wang, Zhihua; Fu, Huimin; Mao, Xiao-Fang

doi:10.1016/j.apm.2018.03.044

Cited by 14 publications

(6 citation statements)

References 25 publications

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“…In this study, the parameters of the Weibull distribution, fitted in terms of the interference threshold, were β = 1.32, 𝜃 = 27.6, 𝛾 = 6, and R 2 = 0.99487. Furthermore, the results obtained by applying the bootstrap method [21], which was implemented to test the goodness-of-fit of the data, showed that more than 90% of the damage threshold test data fell in the 95% confidence interval of the Weibull distri-bution in the 0-45 kV/m interval, and thus could be applied to describe the overall distribution of the data. Furthermore, according to the results depicted by the fitted Weibull curve, when the probability of failure was 95%, the corresponding peak field strength was 40.4 kV/m.…”

Section: Interference Thresholdmentioning

confidence: 99%

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

Yang,

Wen,

et al. 2024

J. Electromagn. Eng. Sci

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With the electromagnetic environment becoming increasingly complex, it is crucial to address the risk posed by electromagnetic pulse, which critically impairs the performance and reliability of electronic systems based on complementary metal oxide semiconductor (CMOS) image sensors. In this context, research on the failure types of CMOS image sensors in a high-power electromagnetic environment, caused by strong electromagnetic pulses and the rapid evaluation method of interference immunity, has garnered significant interest. This paper conducts electromagnetic pulse simulation experiments on CMOS image sensors to first study their failure types, such as image abnormalities and functional interruption, and then identify the corresponding failure criteria. Furthermore, this study builds on the small sample test evaluation method to investigate the interference threshold of functional interruptions in CMOS image sensors by calculating the failure probability at different field strengths. The obtained data were combined with the Weibull distribution function for fitting, the results of which found the interference threshold to be at 40.4 kV/m. The findings of this study provide a basis for evaluating the survivability of CMOS image sensors and their associated reinforcement technology in high-power electromagnetic environments.

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Section: Interference Thresholdmentioning

confidence: 99%

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

Yang,

Wen,

et al. 2024

J. Electromagn. Eng. Sci

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“…In particular, buffer tests of the LBM face the problem of limited sample size and zerofailure data. On the one hand, aerospace machinery products are expensive and produced in limited batches, allowing only small-sample reliability tests [14][15][16]. On the other hand, RDTs typically do not permit sample failures; otherwise, they would be judged as unqualified [17].…”

Section: Introductionmentioning

confidence: 99%

Reliability Assessment for a Spacecraft Landing Buffer Mechanism Based on Small Sample Data

Li,

Fu,

2023

Machines

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The landing buffer mechanism (LBM) is a crucial component of aerospace landing explorations, determining the success of the entire mission. Reliability demonstration tests (RDTs) are required to ensure the LBM’s performance meets the design index. However, the RDTs of the LBM often encounter limited samples and zero-failure data, making traditional binominal test programs and reliability assessment methods based on the maximum likelihood theory unsuitable. This paper introduces a novel small-sample test verification method for the LBM, which transforms traditional binominal tests into more informative metrological tests by measuring the buffer strokes of the LBM’s subsystems. Furthermore, a confidence limit theory for the product of subsystem reliability is developed in conjunction with the reliability series model of the LBM. This theory can use the measurement data of subsystems to assess the confidence limit of the LBM’s reliability. An actual engineering application demonstrates that the proposed method can effectively handle zero-failure data and verifies that the LBM’s reliability exceeds 0.9999 with a confidence of 0.9.

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“…The damage threshold distribution of the main coupling port of the system is obtained by system-level effect threshold tests and statistical distribution fitting methods. However, for practical assessment application, the number of system-under-test (SUT) samples is often limited to less than the sample number required for ordinary statistical distribution fittings [5][6][7][8].…”

Section: Introductionmentioning

confidence: 99%

Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

Xia

Huang

et al. 2022

Energies

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The study of electromagnetic sensitivity of electronic modules is crucial for the selection of a component-level pulse current injection (PCI) waveform, which will determine whether a component-level PCI test is equivalent to a system-level pulse illumination test of the system to which the electronic module belongs. For electromagnetic sensitivity analysis, the equivalence between the injection waveform and a typical high-altitude electromagnetic pulse (HEMP) conducted disturbance waveform in a component-level PCI test is studied. Based on an RF low noise amplifier (LNA) test board, component-level PCI tests were performed using 20 ns/500 ns double exponential wave and square-wave pulse with multiple pulse-widths. The damage threshold was analyzed and determined by using vector norm and its internal damage was observed and validated by optical microscopic analysis. The conclusions are demonstrated as follows: first, during square-wave PCI tests of RF LNA, the electromagnetic sensitive parameter action is divided into three regions by pulse-width range, called ∞-norm, 2-norm and competitive failure-dominating regions; second, the electromagnetic damage effect of the RF LNA is mainly caused by the burning of its two cascaded transistors, forming a pulse energy transmission channel with short-circuit impedance from the input port to the ground; third, the 100 ns-width square waveform can be determined as the equivalent injection waveform of a HEMP conducted waveform, and the pulse peak value of injected current is determined as the electromagnetic sensitive parameter for square-wave PCI tests of the RF LNA. The conclusions verified the feasibility of establishing the equivalence between different pulse waveforms according to the electromagnetic sensitivity analysis based on the vector norm theory and effect mechanism analysis.

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Interval statistic based reliability analysis method on small sample hot test of satellite thruster

Cited by 14 publications

References 25 publications

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

Analysis of the Interference Effects in CMOS Image Sensors Caused by Strong Electromagnetic Pulses

Reliability Assessment for a Spacecraft Landing Buffer Mechanism Based on Small Sample Data

Research on Electromagnetic Susceptibility of Electronic Modules in Component-Level HEMP PCI Test

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