2022
DOI: 10.1021/acsami.2c07609
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Interrelation of the CdTe Grain Size, Postgrowth Processing, and Window Layer Selection on Solar Cell Performance

Abstract: Recent improvements to the CdTe solar cell device structure have focused on replacing the CdS window layer with a more transparent material to reduce parasitic absorption and increase J sc, as well as incorporating selenium into the absorber layer to achieve a graded band gap. However, altering the CdTe device structure is nontrivial due to the interdependent nature of device processing steps. The choice of the window layer influences the grain structure of the CdTe layer, which in turn can affect the chloride… Show more

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Cited by 8 publications
(2 citation statements)
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“…QE measurement can be used to probe the mechanism underlying the performance changes brought on by grain size and post‐growth treatment. [ 41 ] The voltage dependence of the collection efficiency, series resistance, the electrical barrier of the back contact, photo‐conductive effects in the window and absorber layers, and any secondary barriers in the primary junction can all have an impact on the quantum efficiency measurement of CZT and CMT PV cells (when measuring under forwarding voltage). Although each of these indicators has a unique signature, misinterpretation is conceivable and possibly prevalent without precise measurements of these elements.…”
Section: Resultsmentioning
confidence: 99%
“…QE measurement can be used to probe the mechanism underlying the performance changes brought on by grain size and post‐growth treatment. [ 41 ] The voltage dependence of the collection efficiency, series resistance, the electrical barrier of the back contact, photo‐conductive effects in the window and absorber layers, and any secondary barriers in the primary junction can all have an impact on the quantum efficiency measurement of CZT and CMT PV cells (when measuring under forwarding voltage). Although each of these indicators has a unique signature, misinterpretation is conceivable and possibly prevalent without precise measurements of these elements.…”
Section: Resultsmentioning
confidence: 99%
“…During the transition to metal oxide ETLs, CdTe devices similarly struggled with charge accumulation at the ETL/absorber interface and resulting J-V distortion, [11,[57][58][59][60][61][62] which was eventually alleviated through interface engineering with CdSe x Te 1-x (CST) absorber grading at the junction. The current record TiO 2 /Sb 2 (S,Se) 3 device similarly benefited from absorber grading with a sulfur-rich junction to suppress interfacial carrier recombination.…”
Section: Device Optimizationmentioning
confidence: 99%