2021
DOI: 10.1016/j.apsusc.2020.148135
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Intermetallics-induced directional growth of Sn whiskers in Sn-3.5Ag coating on Al substrate

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Cited by 16 publications
(4 citation statements)
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“…Using the soldering process, Tian et al studied the directional growth of Sn whiskers on an Al substrate to investigate the effect of intermetallic induction on the growth of whiskers [ 74 ]. An Al substrate with dimensions of 15 mm × 15 mm × 1 mm was pretreated to secure the deoxidization before the soldering process.…”
Section: Manufacturing Methodsmentioning
confidence: 99%
“…Using the soldering process, Tian et al studied the directional growth of Sn whiskers on an Al substrate to investigate the effect of intermetallic induction on the growth of whiskers [ 74 ]. An Al substrate with dimensions of 15 mm × 15 mm × 1 mm was pretreated to secure the deoxidization before the soldering process.…”
Section: Manufacturing Methodsmentioning
confidence: 99%
“…The mechanism of phase evolution in friction stir welding (FSW) involves several factors including process parameters, temperature, strain rate, residual stress and reaction kinetics. The temperature rise at the Al/Ti interface and the accumulation of residual stresses in the deformed Ti particles promote elemental diffusion [25,26], leading to the formation of intermetallic phases such as AlTi and Al 3 Ti [6,27]. The higher surface-tovolume ratio of fine Ti particles enhances the inter-diffusion of Al and Ti, leading to the formation of more intermetallics compared to large flakes.…”
Section: Mechanism Of Phase Evolutionmentioning
confidence: 99%
“…Kitano et al [47] also investigated the SRO of a disordered δ phase using X-ray and electron diffraction methods. Various simulation techniques were employed to ascertain the stability and ground-state structure of Ag 2 Al precipitates [18,48,49]. These studies have indicated that the bulk equilibrium δ phase and γ precipitates share an hcp structure with off-stoichiometric disordered characteristics but exhibit distinct ordering arrangements within the basal planes of the hcp structure.…”
Section: Crystal Structure Analysis Of Each Phasementioning
confidence: 99%