2012
DOI: 10.1016/j.egypro.2012.07.126
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Intermetallic Phase Growth and Reliability of Sn-Ag-Soldered Solar Cell Joints

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Cited by 49 publications
(22 citation statements)
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“…This implies that this section of the solder interconnection is a critical failure site where crack initiation and propagation is most likely to begin. This observation agrees with the experimental observation by Schmitt et al [22] whose result showed greater solder joint degradation at the solder/Ag interface. Figure 11 shows the hysteresis loop of solder for six thermal cycles which was plotted using equivalent creep strain and stress.…”
Section: Study On Equivalent Stresssupporting
confidence: 93%
“…This implies that this section of the solder interconnection is a critical failure site where crack initiation and propagation is most likely to begin. This observation agrees with the experimental observation by Schmitt et al [22] whose result showed greater solder joint degradation at the solder/Ag interface. Figure 11 shows the hysteresis loop of solder for six thermal cycles which was plotted using equivalent creep strain and stress.…”
Section: Study On Equivalent Stresssupporting
confidence: 93%
“…In this approach, the cell is removed from the module, mounted in an epoxy and the cross-section is exposed through polishing. Chemical analysis is also possible through energy dispersive x-ray analysis (EDX), permitting an in-depth study of the metallic phases near the bond [66,67]. Clearly, this technique requires destroying the original cell, but useful information about the solder bond quality, such as voids and cracks, may be obtained, which could then be used for process optimization.…”
Section: Imaging Techniquesmentioning
confidence: 99%
“…The intermetallic compounds, which will decrease the joints performance and module reliability, appear mainly at the interfaces of copper/solder (CuSn) and solder/metalization (AgSn). The thickness of intermetallics increase with soldering temperature and time [3].…”
Section: Introductionmentioning
confidence: 98%