Interlayer Hall Effect in n-type doped high temperature superconductor Nd<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si1.svg"><mml:msub><mml:mrow/><mml:mrow><mml:mn>2</mml:mn><mml:mo>−</mml:mo><mml:mi>x</mml:mi></mml:mrow></mml:msub></mml:math>Ce CuO<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si2.svg"><mml:msub><mml:mrow/><mml:mrow><mml:mn>4</mml:mn><mml:mo>+</mml:mo><mml:mi>δ</mml:mi></mml:mrow></mml:msub></mml:math>

Popov, M. R.; Клепикова, А. С.; Shelushinina, N. G.; Иванов, А. А.; Charikova, T. B.

doi:10.1016/j.physc.2019.1353515

Cited by 5 publications

(3 citation statements)

References 40 publications

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“…For Nd2-xCexCuO4 with x = 0.145 we obtained 2 =1600, ξab(0) = 110 Å [9] and for d = 6Å…”

Section: Resultsmentioning

confidence: 80%

“…For this purpose, we have synthesized by pulsed laser deposition Nd2-xCexCuO4+δ/SrTiO3 epitaxial film (1ī0) with optimal oxygen content δ=0 and x = 0.145 [9], where the c-axis of the Nd2-xCexCuO4+δ lattice is directed along the short side of the SrTiO3 substrate (Fig. 1).…”

Section: Methodsmentioning

confidence: 99%

“…For this purpose, we have synthesized by pulsed laser deposition Nd2-xCexCuO4+δ/SrTiO3 epitaxial films with optimal oxygen content δ=0 and x = 0.135, 0.145 and 0.15 of three types [26]: I -films with standard orientation (001) where the c-axis of the Nd2-xCexCuO4+δ lattice is perpendicular to the SrTiO3 substrate plane; to measure the longitudinal ρxx ab and Hall ρxy ab resistivities in CuO2 layers. II-films (1ī0) where the c-axis of the Nd2-xCexCuO4+δ lattice is directed along the long side of the SrTiO3 substrate; to measure the longitudinal ρxx c resistivity between (across) CuO2 layers.…”

Section: Methodsmentioning

confidence: 99%

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