2020
DOI: 10.1364/oe.380788
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Interferometric method for determining the losses of spatially multi-mode nonlinear waveguides based on second harmonic generation.

Abstract: The characterisation of loss in optical waveguides is essential in understanding the performance of these devices and their limitations. Whilst interferometric-based methods generally provide the best results for low-loss waveguides, they are almost exclusively used to provide characterization in cases where the waveguide is spatially singlemode. Here, we introduce a Fabry-Pérot-based scheme to estimate the losses of a nonlinear (birefringent or quasi-phase matched) waveguide at a wavelength where it is multi-… Show more

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Cited by 3 publications
(3 citation statements)
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“…Santandrea et al. [ 125 ] introduced a method to estimate the loss of nonlinear waveguides at multimode wavelengths. By fitting the phase‐matched spectra of different titanium‐diffused LN waveguides to their model, a single spatial second‐harmonic loss of the mode at the spatial multimode wavelength was obtained.…”
Section: Physical Property Characterizationmentioning
confidence: 99%
See 1 more Smart Citation
“…Santandrea et al. [ 125 ] introduced a method to estimate the loss of nonlinear waveguides at multimode wavelengths. By fitting the phase‐matched spectra of different titanium‐diffused LN waveguides to their model, a single spatial second‐harmonic loss of the mode at the spatial multimode wavelength was obtained.…”
Section: Physical Property Characterizationmentioning
confidence: 99%
“…[120] Sattibabu et al [124] proposed a non-destructive and simple spectroscopic method to measure a single-mode optical waveguide's coupling and transmission losses, and they demonstrated this technique using a fabricated Ti:LN waveguide. Santandrea et al [125] introduced a method to estimate the loss of nonlinear waveguides at multimode wavelengths. By fitting the phase-matched spectra of different titanium-diffused LN waveguides to their model, a single spatial second-harmonic F I G U R E  Four-inch LN wafer thickness uniformity characterization: (A) before device processing and (B) after device processing.…”
Section:  Optical Waveguide Propagation Lossmentioning
confidence: 99%
“…As is often the case, these benefits do not come without a cost. Waveguides typically have higher losses than their bulk counterparts, are more often strongly impacted by production errors, and are sometimes susceptible to photothermal and/or photorefractive effects [8,9,10]. Furthermore, these issues are typically exacerbated when using optical fields at higher frequencies, making processes such as high power and/or efficient second harmonic generation (SHG) particularly difficult.…”
mentioning
confidence: 99%